FRT GmbH launches integrated metrology solution for microchip production

FRT GmbH introduced the MicroProf® AP to the market in October. The metrology tool is specially developed for demanding applications in 3D IC packaging. With the MicroProf® AP, FRT offers a comprehensive measuring tool with which metrology tasks can be solved throughout the entire process chain and which is able to handle wafers and panels, thinned and bonded wafers, and film frames.

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