news

Here you will find the latest publications and news from and with FRT. If you want to learn more about FRT, visit us on Twitter or LinkedIn.

05/30/2017

The MicroProf® family is growing: The MicroProf® TL

The FRT MicroProf® TL is the newest member of the MicroProf® series. Like any other MicroProf®, the ‘TL’ (thermal load) is an optical surface...

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05/23/2017

You always know who is putting today: the MicroProf® MHU

For many industrial applications it is necessary to perform measurements fully automatically with high throughput rates. For this purpose an automatic...

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05/16/2017

The twin brother: The MicroProf® FE

The FRT MicroProf® FE is our standard tool for automated 2D/3D wafer metrology. It combines the capabilities of the worldwide established MicroProf®...

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05/09/2017

The first Metrology Tuesday in the new look with the MicroProf® FS

The FRT MicroProf® FS is a fully automatic device for wafer metrology, which can be adapted to many applications. Flexibility and versatility are key...

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05/04/2017

FRT 4.0 – with High Speed into the Future!

In May 2017 FRT GmbH starts its Relaunch Year. FRT has grown up with its very successful 3. generation metrology systems and a new design. Much of the...

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