Even curved surfaces can be measured very precisely without contact. Today's measuring technology makes it possible to record polished, grinded, turned or milled optical surfaces. For quality assurance, various dimensions of lenses are checked - including surface measurements, as well as single and multiple profiles.
With modern surface measuring tools, you can quickly and accurately determine the shape of your lenses and detect deviations from the ideal shape. The radius of curvature (RoC) of a lens is determined particularly quickly by profile measurements. In this case, only a few seconds are needed to measure a lens.
Also the layer thickness determination of optical coatings in the form of thin films, or even layer stacks, is no longer a problem for current measurement technology. Layer thicknesses of up to several nanometers are determined, with a resolution in the sub-nanometer range.
Lens roughness can be determined down to the sub-nanometer range and topography measurements of the sample surface can be performed, too. Other applications include the measurement of defects, etc. This results in high flexibility when investigating different lens types.
The devices of the MicroProf® series offer the option of double-sided sample inspection. This allows simultaneous measurement of the top and bottom of the sample and determination of the sample thickness. Thus the total thickness variation (TTV) of the sample can be determined together with surface parameters, e.g. roughness and flatness of both sides.
There is the possibility of automated sample mapping, as well as the execution of evaluation routines. FRT's own automation software Acquire Automation XT offers freely definable parameter sets for the measurement of different lens geometries, a function for aspherical fit as well as the comparison between nominal and actual geometry.
Do you have any further questions or comments? Then contact us! Our experts will be happy to help you solve your measuring tasks.
Topography measurement of a concave lens
Topography measurement of a defect on the front lens of an objective
Area measurement of a lens surface with nm roughness
Curvature profile of a concave lens with fit curve
Bottom topography of a freeform optics
Metrology Solution: MicroProf®200