The spring issue of the HEADLINE has arrived!

Learn in this exciting issue a) which award FRT GmbH received for the MircoProf® b) how the new "layer mode" for image field sensors enables the measurement of topography data of transparent layers! c) with which process grinding and dicing results of strongly structured wafers are significantly improved and which role FRT GmbH plays! d) current breaking news and event dates.

We hope you enjoy reading it.

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