Here you can find current publications and news of FRT. If you want to have more information about FRT please visit us on, twitter or LinkedIn. Here you will find everything about metrology.


The new issue of the headline has arrived

Just in time for the start of Semicon Europa we publish our magazine Headline, the second issue of our RelaunchYear. Six months have passed since the...

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Confidence in Optical Thickness Measurements

We published an article of confidence in optical thickness measurement in the magazin Optik & photonik. Have a look!

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It is no longer possible without: non-contact surface measurement technology for perfect medical technology

The miniaturization trend in medical technology is progressing rapidly. The focus of the development and manufacture of medical-technical products is...

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In situ surface measurement

Whether it’s a large machine, an inaccessible vehicle cab, a fixed roller or a heavy glass panel: the MicroSpy® Mobile is used when measuring “in...

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Everything tight! Optical measurement technology for quality control of seals and sealing surfaces

Secure sealing is a major technical challenge in many industries. For example, seals are used in the automotive industry, in the chemical industry and...

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FRT Metrology - best you can get for 2D and 3D

With the MicroProf® from FRT, a wide range of measurement tasks can be carried out quickly, efficiently and intuitively. As an established standard...

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Silicon goes 3D - TSVs and Trenches as the key technology of a new generation of semiconductors

Most of the pressure comes from the cost side as usual. But there are many reasons for developments in the area of ​​3D IC. Moore’s Law goes on for a...

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FRT Mark III – Evaluation platform for comprehensive analysis of topography and image data

Whether for new developments, process control or damage analysis – it is always necessary to carry out a large number of different measurements on...

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In-house FRT software for your automation - Acquire Automation XT

High-tech production can no longer be without industrial automation. It increases the efficiency in production and ensures shorter delivery times and...

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Bottleneck in the field of metrology - does not have to be! Surface analysis as a service

Ideal for newcomers or companies who rarely (yet) measure, or if it is just tight – the service at FRT. Our experts provide their knowledge to our...

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Stress measurements with the MicroProf®

During the production or thermal treatment of thin layers, stress can arise in the layers. This is caused, for example, by different lattice...

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Certainly the desired quality - Impressive imprint thanks to optical measuring technology

Packaging production for branded products is no longer just a question of print quality and repeatability. The quality and features of packaging are...

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Patterned Sapphire Substrate Process: Increase your yield with the use of intelligent FRT measurement technology

Whatever is produced, no matter what material and in which quantities – impeccable quality is achieved only by consistently high perfection. And...

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Film thickness measurement with high-performance technology – FRT offers the ideal surface measuring device for every layer

Thin coatings play an increasingly important role in both technical and decorative applications. Depending on the application area, the functionality...

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Measuring inaccessible parameters – FRT has the right solution: hybrid metrology

Semiconductor, MST / MEMS / Nano, Sapphire / LED, Photovoltaic, Automotive, Mechanical Engineering, Medical Technology, Optics, Packaging … – the...

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Headline 2017

Would you like to know what's new at FRT? Then just look at our magazin Headline.

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Nowadays electronic devices are indispensable – PCBs make it possible

Nearly every electronic device has one or more PCBs that are used to mechanically mount and electrically connect electronic components. We offer...

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When it has to go fast: the FRT SLS

The FRT SLS is a fast optical line sensor for applications where high measuring speeds are required. Typical applications are the determination of 3D...

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Whoever has the clear view is in first place: the right solution for measurement tasks from optics

No matter whether large lenses or micro optics, the systems are becoming more complex, with multiple production processes and have already...

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The MicroProf® family is growing: The MicroProf® TL

The FRT MicroProf® TL is the newest member of the MicroProf® series. Like any other MicroProf®, the ‘TL’ (thermal load) is an optical surface...

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You always know who is putting today: the MicroProf® MHU

For many industrial applications it is necessary to perform measurements fully automatically with high throughput rates. For this purpose an automatic...

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The twin brother: The MicroProf® FE

The FRT MicroProf® FE is our standard tool for automated 2D/3D wafer metrology. It combines the capabilities of the worldwide established MicroProf®...

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The first Metrology Tuesday in the new look with the MicroProf® FS

The FRT MicroProf® FS is a fully automatic device for wafer metrology, which can be adapted to many applications.

Flexibility and versatility are key...

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FRT 4.0 – with High Speed into the Future!

In May 2017 FRT GmbH starts its Relaunch Year. FRT has grown up with its very successful 3. generation metrology systems and a new design. Much of the...

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