news
Here you will find the latest publications and news from and with FRT. If you want to learn more about FRT, visit us on Twitter or LinkedIn.
03/31/2020
We can do it: Determine parameters with hybrid metrology that cannot be measured directly!
Components and measuring tasks in 3D surface metrology are becoming more and more complex. Certain measurement tasks can no longer be solved by a...
03/24/2020
Optical versus tactile - Comparison of measurement methods
Which method is the better one? What are the advantages and disadvantages? Which requirements can be fulfilled with the individual methods? Both...
03/20/2020
Virtual App Lab (VAL): Visit the FRT Application Lab without travelling!
Meet our sales and application experts in the "virtual" application laboratory: Experience our multi-sensor measuring tools live via video conference...
03/17/2020
Vertical Cavity Surface Emitting Laser - VCSEL technology takes off
VCSEL is one of the future technologies and stands for "Vertical Cavity Surface Emitting Laser". The laser products are particularly interesting for...
03/10/2020
CWL - Chromatic white light sensor for fast and high-precision metrology
Configurable for a multitude of measuring tasks and surfaces In the investigation of flat, extended structures, a number of questions have to be...
03/03/2020
Comprehensive service guarantees customer satisfaction
Expansion of the service and maintenance department FRT GmbH offers 3D surface metrology for research, production and quality assurance. With micro-...
02/25/2020
Surface measurement as a contract service
Surface measurement as a contract service Economical solution for temporary or changing applications Ideal for first-time users or companies that...
02/18/2020
Training provides know-how of the experts
From practice for practice Increase your efficiency through knowledge The demands placed on employees and technologies in everyday operations are...
02/11/2020
IR Microscope - 2D analysis by IR transmission images
The IR microscope acquires transmission images for optical, non-contact and non-destructive 2D analysis of structures in NIR transparent materials....![[Translate to English:] IR-Mikroskop](https://frtmetrology.com/fileadmin/user_upload/MT_Infografik_20200211_preview.jpg "[Translate to English:] IR-Mikroskop")
02/03/2020
MicroProf® DI – High-Precision Optical Surface Inspection for Semiconductor Applications (Part 2)
Intelligent defect analysis prevent yield loss through early identification The optical inspection system MicroProf® DI enables the inspection of...![[Translate to English:] MicroProf® DI](https://frtmetrology.com/fileadmin/user_upload/MT_Infografik_20200204_preview.jpg "[Translate to English:] MicroProf® DI")