News

WLI FL - Powerful white light interferometer for fast, large-area topography measurements with excellent height resolution

The small lateral dimension of structures often is a problem for the measuring techniques, because the optical resolution of the methods is usually...

Topography measurement on optical lenses

For process control in the manufacturing of plastic lenses, the topography of strongly curved lenses with high resolution is to be measured and the...

The spring issue of the HEADLINE has arrived!

Learn in this exciting issue a) which award FRT GmbH received for the MircoProf® b) how the new "layer mode" for image field sensors enables the...

FRT Equipment Supplier of the Year 2018

3D InCites announced FRT as "Equipment Supplier of the Year". 3D InCites was asking to vote 40 nominees from 26 companies and four research institutes...

Topography measurement under thermal load

In order to always meet current customer demands, we have expanded our product portfolio and offer our surface metrology tools with an optional the...

CWL FT - High precision measurement of thin transparent films in the micrometer range

The CWL FT is an interferometric film thickness sensor especially designed to measure the thickness of products such as films or coatings that are...

Metrology Know-How: Measuring solutions for all wafer applications

Semiconductors and MEMS are becoming more and more miniaturized. This increases the demands on the metrology used to control the quality of the wafers...

Intuitive measurement software from FRT – Acquire

Whether for new developments, process control or damage analysis – it is almost always necessary to carry out a large number of different...

The MicroProf® 100 table-top tool – just as strong as the big ones

The popular MicroProf^® 100 from the FRT measuring instrument family sets new standards in optical measurement technology.

As a compact table-top tool...

Fully automated optical surface measurement opens up potential for your production

Inspection of incoming material, monitoring of individual production steps or quality assurance of finished products – optical surface measurement...

FRT multi-sensor technology: the non plus ultra for the manufacturing of innovative products in mechanical engineering

The precise measurement of surfaces in mechanical engineering is essential for both R&D and industrial production control. It is important to...

Competitive advantage in the photovoltaic industry – Optical surface measurement technology optimizes production of new generations of solar wafers

The non-destructive characterization of surface structures on solar wafers is of increasing importance, because it can offer solutions for many ...

The MicroGlider® series – sensationally sensitive

Surface properties play a central role in almost all areas of industrial or manual manufacturing. Whether a material is optimal for its later use...

Versatility for laboratory and production – confocal and interferometric measurement technology in one

FRT offers the optimal solution for customers who need more than just confocal microscopy for their measuring tasks. Dual Technology “, or DT for...

High-precision thickness and TTV measurement for wafer manufacturing

Sawing, grinding, lapping, polishing… These are the typical processing steps that lead from the initial product “Ingot” to high-quality wafers....

Non-contact metrology solutions for front- and back-end

The trend in technology towards smaller and smaller electronic devices requires new approaches in the production of wafers. Increasingly complex...

The new issue of the headline has arrived

Just in time for the start of Semicon Europa we publish our magazine Headline, the second issue of our RelaunchYear. Six months have passed since the...

FRT measuring instruments help to realize ambitious roadmaps in the sapphire and LED industry.

Whatever is produced, no matter from which material and in what quantities – perfect quality can only be achieved by consistently high perfection....

Comprehensive service guarantees customer satisfaction

FRT GmbH offers 3D surface measurement technology for research, production and quality assurance. With micro- and nanometer resolution, the...

Optical measurement technology is making a breakthrough in the automotive industry

The modern automotive industry is faced with great challenges with regard to the increasing quality demands of its innovative products. The...

Confidence in Optical Thickness Measurements

We published an article of confidence in optical thickness measurement in the magazin Optik & photonik. Have a look!

BGA and solder point measurement with optical 3D surface measurement technology from FRT.

A wide variety of measurement tasks have to be solved in the process-related inspection of BGAs (ball grid arrays) and soldering points as well as pri...

Roughness measurement - essential and highly precise

Whether in research and development, process or quality control: an exact roughness measurement of work pieces or finished products is indispensable...

Metrology for MEMS - more than just a trend

The complexity of integrated circuits is increasing significantly – and is an amazing innovation factor. At the same time, this development presents...

It is no longer possible without: non-contact surface measurement technology for perfect medical technology

The miniaturization trend in medical technology is progressing rapidly. The focus of the development and manufacture of medical-technical products is...

In situ surface measurement

Whether it’s a large machine, an inaccessible vehicle cab, a fixed roller or a heavy glass panel: the MicroSpy^® Mobile is used when measuring “in...

Everything tight! Optical measurement technology for quality control of seals and sealing surfaces

Secure sealing is a major technical challenge in many industries. For example, seals are used in the automotive industry, in the chemical industry and...

Silicon goes 3D - TSVs and Trenches as the key technology of a new generation of semiconductors

Most of the pressure comes from the cost side as usual. But there are many reasons for developments in the area of ​​3D IC. Moore’s Law goes on for a...

FRT Mark III – Evaluation platform for comprehensive analysis of topography and image data

Whether for new developments, process control or damage analysis – it is always necessary to carry out a large number of different measurements on...

In-house FRT software for your automation - Acquire Automation XT

High-tech production can no longer be without industrial automation. It increases the efficiency in production and ensures shorter delivery times and...

Bottleneck in the field of metrology - does not have to be! Surface analysis as a service

Ideal for newcomers or companies who rarely (yet) measure, or if it is just tight – the service at FRT. Our experts provide their knowledge to our...

Stress measurements with the MicroProf®

During the production or thermal treatment of thin layers, stress can arise in the layers. This is caused, for example, by different lattice...

Certainly the desired quality - Impressive imprint thanks to optical measuring technology

Packaging production for branded products is no longer just a question of print quality and repeatability. The quality and features of packaging are...

Patterned-Sapphire-Substrate Process: Increase your yield with the use of intelligent FRT measurement technology

Whatever is produced, no matter what material and in which quantities – impeccable quality is achieved only by consistently high perfection. And...

Film thickness measurement with high-performance technology – FRT offers the ideal surface measuring device for every layer

Thin coatings play an increasingly important role in both technical and decorative applications. Depending on the application area, the functionality...

Measuring inaccessible parameters – FRT has the right solution: hybrid metrology

Semiconductor, MST / MEMS / Nano, Sapphire / LED, Photovoltaic, Automotive, Mechanical Engineering, Medical Technology, Optics, Packaging … – the...

Headline May 2017

Would you like to know what's new at FRT? Then just look at our magazin Headline.

Nowadays electronic devices are indispensable – PCBs make it possible

Nearly every electronic device has one or more PCBs that are used to mechanically mount and electrically connect electronic components. We offer...

When it has to go fast: the FRT SLS

The FRT SLS is a fast optical line sensor for applications where high measuring speeds are required. Typical applications are the determination of 3D...

Whoever has the clear view is in first place: the right solution for measurement tasks from optics

No matter whether large lenses or micro optics, the systems are becoming more complex, with multiple production processes and have already...

The MicroProf® family is growing: The MicroProf® TL

The FRT MicroProf^® TL is the newest member of the MicroProf^® series. Like any other MicroProf^®, the ‘TL’ (thermal load) is an optical surface...

You always know who is putting today: the MicroProf® MHU

For many industrial applications it is necessary to perform measurements fully automatically with high throughput rates. For this purpose an automatic...

The twin brother: The MicroProf® FE

The FRT MicroProf^® FE is our standard tool for automated 2D/3D wafer metrology. It combines the capabilities of the worldwide established MicroProf^®...

The first Metrology Tuesday in the new look with the MicroProf® FS

The FRT MicroProf^® FS is a fully automatic device for wafer metrology, which can be adapted to many applications.

Flexibility and versatility are key...

FRT 4.0 – with High Speed into the Future!

In May 2017 FRT GmbH starts its Relaunch Year. FRT has grown up with its very successful 3. generation metrology systems and a new design. Much of the...