News

Here you can find current publications and news of FRT. If you want to have more information about FRT please visit us on www.frtent.com, twitter or LinkedIn. Here you will find everything about metrology.

10/16/2018

Part 2: Metrology for TSV Fabrication

 

Series: Advanced Packaging - Multi-Sensor Metrology for Every Process Step

Three-dimensional integrated circuit (3D IC) and 2.5D IC with Si...

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Part 2: Metrologie für die TSV-Fertigung
10/09/2018

Part 1: Metrology for Semiconductor Lithography

SERIES Advanced Packaging - Multi-Sensor Metrology for Every Process Step

The fabrication of an integrated circuit (IC) requires a variety of...

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Lithografie
10/02/2018

IR Microscope - 2D analysis by IR transmission images

The IR microscope acquires transmission images for optical, non-contact and non-destructive 2D analysis of structures in NIR transparent materials....

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Infrarot-Mikroskop
09/25/2018

Part 5/5: Now even more features in the basic package

SERIES Acquire Automation XT – FRT's Powerful Multi-Sensor Software

Our efforts towards constant improvements of the in-house operating software of...

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09/18/2018

Part 4/5: Software package for overlay measurement

SERIES Acquire Automation XT – FRT's Powerful Multi-Sensor Software

Nowadays 3D IC production consists of a sequence of steps, where, for instance, a...

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09/11/2018

Part 3/5: New „Layer Mode“ for Field of View sensors

SERIES Acquire Automation XT – FRT’s Powerful Multi Sensor Software

Transparent layers impose challenges in the daily business of topography...

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09/04/2018

Part 2/5: Software Package „Lens Shape“

SERIES Acquire Automation XT – FRT’s Powerful Multi-Sensor Software

Irrespective of large lenses or micro optics, the systems are becoming more...

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08/28/2018

Part 1/5: Hybrid metrology for fast and reliable determination of inaccessible parameters

Semiconductors, MST/MEMS/Nano, Sapphire/LED and many other applications - the...

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08/28/2018

Diversification of Markets Calls for Hybrid Metrology with Multi-Sensor Technology

Excerpt: It used to be that people thought about metrology for front-end process control and inspection for advanced packaging. As wafer level...

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08/21/2018

MicroSpy® FT - High-performance film thickness measuring tool for production control and development

The FRT MicroSpy® FT is used for measuring tasks in production control and in research and development. The MicroSpy® FT is an optical measuring tool...

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Leistungstarkes Schichtdickenmessgerät
08/14/2018

Analysis of rubber samples and determination of filler particle dispersion

The distribution of filler particles in rubber compounds determines the mechanical-dynamic properties of the material. In addition, it is an indicator...

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08/10/2018 Place: FRT GmbH

Check our Job Vacancies!

Photo shoot with colleagues. Result: Great photos that show how cool it is to work for us!

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08/07/2018

MicroSpy® Profile - Entry into non-contact 2D and 3D surface metrology

 

The MicroSpy® Profile is an optical profilometer for entry into non-contact 2D and 3D surface measurement technology. With this FRT surface...

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07/31/2018

Measurement of SU-8 photoresist thickness, homogeneity and topography

SU-8 is a high contrast, epoxy based photoresist for microprocessing and other microelectronic applications where a thick, chemically and thermally...

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07/25/2018

Versatile optical multi-sensor technology in the production of microfluidic systems

 

There are many different optical measurement techniques available today, each with its own specific field of application. Where infrared light...

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07/17/2018

Fast, non-contact surface measurement in precision engineering

 

In the field of precision engineering, measuring tools for surface inspection have to perform a variety of measuring tasks, such as recording the...

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07/10/2018

Non-contact measurement of foils (thickness, topography, roughness)

 

For quality assurance during the production of foils, the thickness must be checked. In the case of foils with functional surfaces, it is also...

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07/03/2018

Bridging the gap between nanometer and meter

 

The analysis of roughness and surface structure is becoming more and more technologically important. The demands on components and finished...

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06/26/2018

Precise surface measurement of paper industry products

Paper products not only have to fulfill the aesthetical requirements of the consumer, but also special technical specifications. "Good" paper depends...

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06/19/2018

Benefit from the comprehensive FRT metrology know-how! Surface measurement as a contract service

Metrology offers enormous optimization potential for companies in a wide variety of fields. Research & development can be accelerated and quality...

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06/12/2018

3D surface metrology for process control in the manufacture of spherical and aspherical lenses

Whether large lenses or microoptics, the systems are becoming increasingly complicated and the manufacturing processes have already entered the...

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06/05/2018

Process control in the production of artificial leather skins

For the process control during the production of artificial leather skins, the exact transfer of the leather pattern to the artificial leather skin...

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05/29/2018

Fast, precise and non-destructive - measurement of thin transparent layers on a wafer

Polymers have become an essential part of modern microelectronics and microsystems technology, microoptics and medical technology. Until now, they...

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05/22/2018

With microstructures to better fixed implants

Very high demands are required of the surfaces of implants. For example, hip and knee endoprotheses or dental implants are fixed directly in the bone...

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05/15/2018

WLI FL - Powerful white light interferometer for fast, large-area topography measurements with excellent height resolution

 

The small lateral dimension of structures often is a problem for the measuring techniques, because the optical resolution of the methods is usually...

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05/08/2018

Topography measurement on optical lenses

For process control in the manufacturing of plastic lenses, the topography of strongly curved lenses with high resolution is to be measured and the...

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04/27/2018

The spring issue of the HEADLINE has arrived!

Learn in this exciting issue a) which award FRT GmbH received for the MircoProf® b) how the new "layer mode" for image field sensors enables the...

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03/09/2018

FRT Equipment Supplier of the Year 2018

3D InCites announced FRT as "Equipment Supplier of the Year". 3D InCites was asking to vote 40 nominees from 26 companies and four research institutes...

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02/20/2018

Topography measurement under thermal load

 

In order to always meet current customer demands, we have expanded our product portfolio and offer our surface metrology tools with an optional the...

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02/13/2018

CWL FT - High precision measurement of thin transparent films in the micrometer range

 

The CWL FT is an interferometric film thickness sensor especially designed to measure the thickness of products such as films or coatings that are...

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01/30/2018

Metrology Know-How: Measuring solutions for all wafer applications

Semiconductors and MEMS are becoming more and more miniaturized. This increases the demands on the metrology used to control the quality of the wafers...

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01/23/2018

Intuitive measurement software from FRT – Acquire

Whether for new developments, process control or damage analysis – it is almost always necessary to carry out a large number of different...

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01/16/2018

The MicroProf® 100 table-top tool – just as strong as the big ones

The popular MicroProf® 100 from the FRT measuring instrument family sets new standards in optical measurement technology.

As a compact table-top tool...

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01/09/2018

Fully automated optical surface measurement opens up potential for your production

Inspection of incoming material, monitoring of individual production steps or quality assurance of finished products – optical surface measurement...

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01/02/2018

FRT multi-sensor technology: the non plus ultra for the manufacturing of innovative products in mechanical engineering

The precise measurement of surfaces in mechanical engineering is essential for both R&D and industrial production control. It is important to...

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12/12/2017

Competitive advantage in the photovoltaic industry – Optical surface measurement technology optimizes production of new generations of solar wafers

The non-destructive characterization of surface structures on solar wafers is of increasing importance, because it can offer solutions for many ...

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12/05/2017

The MicroGlider® series – sensationally sensitive

Surface properties play a central role in almost all areas of industrial or manual manufacturing. Whether a material is optimal for its later use...

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11/28/2017

Versatility for laboratory and production – confocal and interferometric measurement technology in one

FRT offers the optimal solution for customers who need more than just confocal microscopy for their measuring tasks. Dual Technology “, or DT for...

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11/21/2017

High-precision thickness and TTV measurement for wafer manufacturing

Sawing, grinding, lapping, polishing… These are the typical processing steps that lead from the initial product “Ingot” to high-quality wafers....

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11/14/2017

Non-contact metrology solutions for front- and back-end

The trend in technology towards smaller and smaller electronic devices requires new approaches in the production of wafers. Increasingly complex...

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11/14/2017

The new issue of the headline has arrived

Just in time for the start of Semicon Europa we publish our magazine Headline, the second issue of our RelaunchYear. Six months have passed since the...

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11/07/2017

FRT measuring instruments help to realize ambitious roadmaps in the sapphire and LED industry.

Whatever is produced, no matter from which material and in what quantities – perfect quality can only be achieved by consistently high perfection....

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10/24/2017

Comprehensive service guarantees customer satisfaction

FRT GmbH offers 3D surface measurement technology for research, production and quality assurance. With micro- and nanometer resolution, the...

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10/17/2017

Optical measurement technology is making a breakthrough in the automotive industry

The modern automotive industry is faced with great challenges with regard to the increasing quality demands of its innovative products. The...

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10/13/2017

Confidence in Optical Thickness Measurements

We published an article of confidence in optical thickness measurement in the magazin Optik & photonik. Have a look!

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10/10/2017

BGA and solder point measurement with optical 3D surface measurement technology from FRT.

A wide variety of measurement tasks have to be solved in the process-related inspection of BGAs (ball grid arrays) and soldering points as well as pri...

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10/03/2017

Roughness measurement - essential and highly precise

Whether in research and development, process or quality control: an exact roughness measurement of work pieces or finished products is indispensable...

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09/26/2017

Metrology for MEMS - more than just a trend

The complexity of integrated circuits is increasing significantly – and is an amazing innovation factor. At the same time, this development presents...

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09/19/2017

It is no longer possible without: non-contact surface measurement technology for perfect medical technology

The miniaturization trend in medical technology is progressing rapidly. The focus of the development and manufacture of medical-technical products is...

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09/12/2017

In situ surface measurement

Whether it’s a large machine, an inaccessible vehicle cab, a fixed roller or a heavy glass panel: the MicroSpy® Mobile is used when measuring “in...

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09/05/2017

Everything tight! Optical measurement technology for quality control of seals and sealing surfaces

Secure sealing is a major technical challenge in many industries. For example, seals are used in the automotive industry, in the chemical industry and...

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08/29/2017

FRT Metrology - best you can get for 2D and 3D

With the MicroProf® from FRT, a wide range of measurement tasks can be carried out quickly, efficiently and intuitively. As an established standard...

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08/22/2017

Silicon goes 3D - TSVs and Trenches as the key technology of a new generation of semiconductors

Most of the pressure comes from the cost side as usual. But there are many reasons for developments in the area of ​​3D IC. Moore’s Law goes on for a...

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08/15/2017

FRT Mark III – Evaluation platform for comprehensive analysis of topography and image data

Whether for new developments, process control or damage analysis – it is always necessary to carry out a large number of different measurements on...

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08/08/2017

In-house FRT software for your automation - Acquire Automation XT

High-tech production can no longer be without industrial automation. It increases the efficiency in production and ensures shorter delivery times and...

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08/01/2017

Bottleneck in the field of metrology - does not have to be! Surface analysis as a service

Ideal for newcomers or companies who rarely (yet) measure, or if it is just tight – the service at FRT. Our experts provide their knowledge to our...

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07/25/2017

Stress measurements with the MicroProf®

During the production or thermal treatment of thin layers, stress can arise in the layers. This is caused, for example, by different lattice...

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07/18/2017

Certainly the desired quality - Impressive imprint thanks to optical measuring technology

Packaging production for branded products is no longer just a question of print quality and repeatability. The quality and features of packaging are...

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07/11/2017

Patterned-Sapphire-Substrate Process: Increase your yield with the use of intelligent FRT measurement technology

Whatever is produced, no matter what material and in which quantities – impeccable quality is achieved only by consistently high perfection. And...

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07/04/2017

Film thickness measurement with high-performance technology – FRT offers the ideal surface measuring device for every layer

Thin coatings play an increasingly important role in both technical and decorative applications. Depending on the application area, the functionality...

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06/27/2017

Measuring inaccessible parameters – FRT has the right solution: hybrid metrology

Semiconductor, MST / MEMS / Nano, Sapphire / LED, Photovoltaic, Automotive, Mechanical Engineering, Medical Technology, Optics, Packaging … – the...

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06/26/2017

Headline May 2017

Would you like to know what's new at FRT? Then just look at our magazin Headline.

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06/20/2017

Nowadays electronic devices are indispensable – PCBs make it possible

Nearly every electronic device has one or more PCBs that are used to mechanically mount and electrically connect electronic components. We offer...

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06/13/2017

When it has to go fast: the FRT SLS

The FRT SLS is a fast optical line sensor for applications where high measuring speeds are required. Typical applications are the determination of 3D...

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06/06/2017

Whoever has the clear view is in first place: the right solution for measurement tasks from optics

No matter whether large lenses or micro optics, the systems are becoming more complex, with multiple production processes and have already...

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05/30/2017

The MicroProf® family is growing: The MicroProf® TL

The FRT MicroProf® TL is the newest member of the MicroProf® series. Like any other MicroProf®, the ‘TL’ (thermal load) is an optical surface...

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05/23/2017

You always know who is putting today: the MicroProf® MHU

For many industrial applications it is necessary to perform measurements fully automatically with high throughput rates. For this purpose an automatic...

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05/16/2017

The twin brother: The MicroProf® FE

The FRT MicroProf® FE is our standard tool for automated 2D/3D wafer metrology. It combines the capabilities of the worldwide established MicroProf®...

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05/09/2017

The first Metrology Tuesday in the new look with the MicroProf® FS

The FRT MicroProf® FS is a fully automatic device for wafer metrology, which can be adapted to many applications.

Flexibility and versatility are key...

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05/04/2017

FRT 4.0 – with High Speed into the Future!

In May 2017 FRT GmbH starts its Relaunch Year. FRT has grown up with its very successful 3. generation metrology systems and a new design. Much of the...

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