LEDs have long been omnipresent. But all light bulbs are far from being replaced. New LED and OLED technology designs are also being developed. And recognized new applications for this versatile light. We also have a lot of ground to cover in the area of substrates for these products.
This is our domain - FRT measuring instruments are at home here. We offer optical surface measurement technology for various applications in the sapphire and LED sectors.
SEMI-compliant thickness and TTV measurement
Full wafer thickness map
4 profiles of a sapphire wafer showing thickness variation
Graphical display of local wafer parameters
Full wafer thickness map in 3D view
Wafer map with local parameters (LTIR, LTV, LT, LFPD, etc.)
DIN/ISO-compliant roughness and waviness measurement
Profile on the rough side of a sapphire wafer, Ra=0.776 µm
Profile on the polished side of a sapphire wafer, Ra=0.04 µm
Simultaneous topography measurement on both wafer sides
Area measurement of top and bottom topography of a sapphire wafer
Profile measurement of top and bottom topography of a sapphire wafer
Standard topography measurement
Full wafer topography map of bottom side sapphire wafer in 3D view
Topography of a LED in 3D view
Bump dimensions and coplanarity
Area measurement of a wafer with PSS structures in 3D view
Profile measurement along the blue line, bump height and width analysis
Step height and width measurement
Area measurement of a sapphire wafer with gold structure in 3D view
Profile measurement along the red line, step height and width analysis
DIN/ISO-compliant waviness measurement
Full topography map of a sapphire wafer in 3D
Waviness of a sapphire wafer along the red line
SEMI-compliant roll-off measurement
Roll off Amount (RoA) profile pattern
Profile on the edge of a sapphire wafer
Interested in further information about our measuring tool?
If you have any questions or comments, please contact us directly!